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FIB-SEMFIB-SEM / Cryo-FIB
JEOL JIB-4700F
JEOL
Overview
The JEOL JIB-4700F is a multi-beam FIB-SEM system supporting cryo-FIB milling for lamella preparation, with high-resolution SEM imaging for correlative workflows.
Key Features
✓Ga FIB
✓Field-emission SEM
✓Cryo-stage compatible
✓TEM lamella preparation
Typical Applications
Cryo-FIB millingMaterials cross-sectioningTEM sample preparation