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FIB-SEM FIB-SEM / Cryo-FIB
JEOL JIB-4700F JEOL
Overview The JEOL JIB-4700F is a multi-beam FIB-SEM system supporting cryo-FIB milling for lamella preparation, with high-resolution SEM imaging for correlative workflows.
Already have data? I can process it Getting microscope time is often the easy part. I do remote single-particle reconstruction, tomogram segmentation, and sub-tomogram averaging in RELION and cryoSPARC for tomograms from lamellae milled on a JEOL JIB-4700F, including software setup and pipeline troubleshooting.
Prefer email? Write to info@cryoemservices.com .
Projects typically $2,000–5,000, fixed before any work starts. I reply within two business days. Or send project details
Key Features ✓ Ga FIB
✓ Field-emission SEM
✓ Cryo-stage compatible
✓ TEM lamella preparation
Typical Applications Cryo-FIB milling Materials cross-sectioning TEM sample preparation